Items where Subject is "T Technology > TS Manufactures"

Article

Green, J E, Nuhiji, B, Zivtins, K, Bower, P, Grainger, R V, Day, Richard and Scaife, R J (2017) Internal Model Control of a Domestic Microwave for Carbon Composite Curing. IEEE Transactions on Microwave Theory and Techniques, 65 (11). ISSN 0018-9480

Khomenko, Maksym, Veligorskyi, Oleksandr, Chakirov, Roustiam and Vagapov, Yuriy (2019) An ANN-based temperature controller for a plastic injection moulding system. Electronics, 8 (11). ISSN 2079-9292

McMillan, A.J. and Holeczek, K (2016) Explicit Finite Element Modelling as a Development Tool for New Ultrasound Testing Methodologies for Detection and Characterization of Porosity and Defects in Composites. Materials Performance and Characterization, 5 (1). pp. 78-98. ISSN 2165-3992

Miah, Md Salim, Hossain, M.S., Ashraf, M.A., Al-Assaf, Saphwan and McMillan, A.J. (2017) Numerical simulation of non-Newtonian polymer film flow on a rotating spoked annulus. Applied Polymer Science. ISSN 0021-8995

Miah, Md Salim, Hossain, M.S., Ashraf, M.A., Al-Assaf, Saphwan and McMillan, A.J. (2016) Numerical simulation of non-Newtonian polymer film flow on a rotating spoked annulus. Applied Polymer Science. ISSN 0021-8995

Nikolaeva, A, McMillan, A.J. and Gavriushin, S (2016) Synthesis of a discrete-action thermo-bimetallic actuator with a tongue. IOP Conference Series: Materials Science and Engineering, 153 (012005). ISSN 1757-899X

Pearson, John L, Roberts, Gareth W, Rees, Paul and Thompson, Samantha J (2015) Use of a NOM profilometer to measure large aspheric surfaces. Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 9628.

Rees, Paul and Gray, Caroline (2015) Metrology requirements for the serial production of ELT primary mirror segments. Proc. SPIE 9575, Optical Manufacturing and Testing XI, 9575.

Rees, Paul, Mitchell, John B, Volkov, Andy, Asfour, Jean-Michel, Weidner, Frank, Poleshchuk, Alexander G and Nasyrov, Ruslan K (2015) The use of diffractive imitator optics as calibration artefacts. Proc. SPIE 9575, Optical Manufacturing and Testing XI, 9575.